Detection of high-impedance fault in low-voltage DC distribution system via mathematical morphology

Detection of high-impedance fault in low-voltage DC distribution system via mathematical morphology

This study presents a method for high-impedance fault (HIF) detection in a low-voltage DC (LVDC) distribution system via mathematical morphology (MM), which is composed of two elementary transformations, namely, dilation and erosion. Various MM-based filters are used to detect abnormal signals of cu...

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Bibliographic Details
Main Authors: Yun-Sik Oh, Joon Han, Gi-Hyeon Gwon, Doo-Ung Kim, Chul-Ho Noh, Chul-Hwan Kim, Toshihisa Funabashi, Tomonobu Senjyu
Format: Article
Language:English
Published: Taylor & Francis Group 2016-01-01
Series:Journal of International Council on Electrical Engineering
Subjects:
Electromagnetic transient program
high-impedance fault
low-voltage DC distribution system
mathematical morphology
Online Access:http://dx.doi.org/10.1080/22348972.2016.1228493

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