Inspection of Packaged Integrated Circuits using Terahertz Radiation

Inspection of Packaged Integrated Circuits using Terahertz Radiation

Bibliographic Details
Main Authors: Andreas Fritz, Thomas Arnold
Format: Article
Language:English
Published: Exeley Inc. 2014-12-01
Series:International Journal on Smart Sensing and Intelligent Systems
Subjects:
terahertz; Time domain spectroscopy; Wavelet transformation; Wavelet denosing; packaged integrated circuit inspection
Online Access:https://www.exeley.com/exeley/journals/in_jour_smart_sensing_and_intelligent_systems/7/5/pdf/10.21307_ijssis-2019-056.pdf
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spelling doaj-bc47334beac14a619b9dc66598884a252020-11-25T03:02:13ZengExeley Inc.International Journal on Smart Sensing and Intelligent Systems1178-56082014-12-017510.21307/ijssis-2019-056Inspection of Packaged Integrated Circuits using Terahertz RadiationAndreas Fritz0Thomas Arnold1CTR Carinthian Tech Research AG, Villach, AustriaCTR Carinthian Tech Research AG, Villach, Austriahttps://www.exeley.com/exeley/journals/in_jour_smart_sensing_and_intelligent_systems/7/5/pdf/10.21307_ijssis-2019-056.pdfterahertz; Time domain spectroscopy; Wavelet transformation; Wavelet denosing; packaged integrated circuit inspection
collection DOAJ
language English
format Article
sources DOAJ
author Andreas Fritz
Thomas Arnold
spellingShingle Andreas Fritz
Thomas Arnold
Inspection of Packaged Integrated Circuits using Terahertz Radiation
International Journal on Smart Sensing and Intelligent Systems
terahertz; Time domain spectroscopy; Wavelet transformation; Wavelet denosing; packaged integrated circuit inspection
author_facet Andreas Fritz
Thomas Arnold
author_sort Andreas Fritz
title Inspection of Packaged Integrated Circuits using Terahertz Radiation
title_short Inspection of Packaged Integrated Circuits using Terahertz Radiation
title_full Inspection of Packaged Integrated Circuits using Terahertz Radiation
title_fullStr Inspection of Packaged Integrated Circuits using Terahertz Radiation
title_full_unstemmed Inspection of Packaged Integrated Circuits using Terahertz Radiation
title_sort inspection of packaged integrated circuits using terahertz radiation
publisher Exeley Inc.
series International Journal on Smart Sensing and Intelligent Systems
issn 1178-5608
publishDate 2014-12-01
topic terahertz; Time domain spectroscopy; Wavelet transformation; Wavelet denosing; packaged integrated circuit inspection
url https://www.exeley.com/exeley/journals/in_jour_smart_sensing_and_intelligent_systems/7/5/pdf/10.21307_ijssis-2019-056.pdf
work_keys_str_mv AT andreasfritz inspectionofpackagedintegratedcircuitsusingterahertzradiation
AT thomasarnold inspectionofpackagedintegratedcircuitsusingterahertzradiation
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