Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

The on-orbit single-event upset (SEU) rate of nanodevices is closely related to the orbital parameters. In this paper, the on-orbit SEU rate (OOSR) induced by a heavy ion (HI), high-energy proton (HEP) and low-energy proton (LEP) for a 65 nm SRAM device is calculated by using the software SPACE RADI...

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Bibliographic Details
Main Authors:	Bing Ye, Li-Hua Mo, Tao Liu, You-Mei Sun, Jie Liu
Format:	Article
Language:	English
Published:	MDPI AG 2020-12-01
Series:	Symmetry
Subjects:	SRAM single-event upset on-orbit error rate low-energy proton
Online Access:	https://www.mdpi.com/2073-8994/12/12/2030

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