Particle and Photon Detection: Counting and Energy Measurement

• Main Authors: James Janesick, John Tower
• Format: Article
• Language: English
• Published: MDPI AG 2016-05-01
• Series: Sensors
• Subjects: ultra low noise; CCD; CMOS; imagers
• Online Access: http://www.mdpi.com/1424-8220/16/5/688

Fundamental limits for photon counting and photon energy measurement are reviewed for CCD and CMOS imagers. The challenges to extend photon counting into the visible/nIR wavelengths and achieve energy measurement in the UV with specific read noise requirements are discussed. Pixel flicker and random telegraph noise sources are highlighted along with various methods used in reducing their contribution on the sensor’s read noise floor. Practical requirements for quantum efficiency, charge collection efficiency, and charge transfer efficiency that interfere with photon counting performance are discussed. Lastly we will review current efforts in reducing flicker noise head-on, in hopes to drive read noise substantially below 1 carrier rms.