Temperature-Dependent Helium Ion-Beam Mixing in an Amorphous SiOC/Crystalline Fe Composite
Temperature dependent He-irradiation-induced ion-beam mixing between amorphous silicon oxycarbide (SiOC) and crystalline Fe was examined with a transmission electron microscope (TEM) and via Rutherford backscattering spectrometry (RBS). The Fe marker layer (7.2 ± 0.8 nm) was placed in between two am...
Main Authors: | , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2016-10-01
|
Series: | Metals |
Subjects: | |
Online Access: | http://www.mdpi.com/2075-4701/6/11/261 |
id |
doaj-c2ae91319d45401b8cfd8e05b8072c9c |
---|---|
record_format |
Article |
spelling |
doaj-c2ae91319d45401b8cfd8e05b8072c9c2020-11-24T23:16:34ZengMDPI AGMetals2075-47012016-10-0161126110.3390/met6110261met6110261Temperature-Dependent Helium Ion-Beam Mixing in an Amorphous SiOC/Crystalline Fe CompositeQing Su0Lloyd Price1Lin Shao2Michael Nastasi3Nebraska Center for Energy Sciences Research, University of Nebraska-Lincoln, Lincoln, NE 68583-0857, USADepartment of Nuclear Engineering, Texas A & M University, College Station, TX 77843-3128, USADepartment of Nuclear Engineering, Texas A & M University, College Station, TX 77843-3128, USANebraska Center for Energy Sciences Research, University of Nebraska-Lincoln, Lincoln, NE 68583-0857, USATemperature dependent He-irradiation-induced ion-beam mixing between amorphous silicon oxycarbide (SiOC) and crystalline Fe was examined with a transmission electron microscope (TEM) and via Rutherford backscattering spectrometry (RBS). The Fe marker layer (7.2 ± 0.8 nm) was placed in between two amorphous SiOC layers (200 nm). The amount of ion-beam mixing after 298, 473, 673, 873, and 1073 K irradiation was investigated. Both TEM and RBS results showed no ion-beam mixing between Fe and SiOC after 473 and 673 K irradiation and a very trivial amount of ion-beam mixing (~2 nm) after 298 K irradiation. At irradiation temperatures higher than 873 K, the Fe marker layer broke down and RBS could no longer be used to quantitatively examine the amount of ion mixing. The results indicate that the Fe/SiOC nanocomposite is thermally stable and tends to demix in the temperature range from 473 to 673 K. For application of this composite structure at temperatures of 873 K or higher, layer stability is a key consideration.http://www.mdpi.com/2075-4701/6/11/261radiation tolerant materialsamorphous SiOCnanocrystalline Feamorphous/crystalline interface |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Qing Su Lloyd Price Lin Shao Michael Nastasi |
spellingShingle |
Qing Su Lloyd Price Lin Shao Michael Nastasi Temperature-Dependent Helium Ion-Beam Mixing in an Amorphous SiOC/Crystalline Fe Composite Metals radiation tolerant materials amorphous SiOC nanocrystalline Fe amorphous/crystalline interface |
author_facet |
Qing Su Lloyd Price Lin Shao Michael Nastasi |
author_sort |
Qing Su |
title |
Temperature-Dependent Helium Ion-Beam Mixing in an Amorphous SiOC/Crystalline Fe Composite |
title_short |
Temperature-Dependent Helium Ion-Beam Mixing in an Amorphous SiOC/Crystalline Fe Composite |
title_full |
Temperature-Dependent Helium Ion-Beam Mixing in an Amorphous SiOC/Crystalline Fe Composite |
title_fullStr |
Temperature-Dependent Helium Ion-Beam Mixing in an Amorphous SiOC/Crystalline Fe Composite |
title_full_unstemmed |
Temperature-Dependent Helium Ion-Beam Mixing in an Amorphous SiOC/Crystalline Fe Composite |
title_sort |
temperature-dependent helium ion-beam mixing in an amorphous sioc/crystalline fe composite |
publisher |
MDPI AG |
series |
Metals |
issn |
2075-4701 |
publishDate |
2016-10-01 |
description |
Temperature dependent He-irradiation-induced ion-beam mixing between amorphous silicon oxycarbide (SiOC) and crystalline Fe was examined with a transmission electron microscope (TEM) and via Rutherford backscattering spectrometry (RBS). The Fe marker layer (7.2 ± 0.8 nm) was placed in between two amorphous SiOC layers (200 nm). The amount of ion-beam mixing after 298, 473, 673, 873, and 1073 K irradiation was investigated. Both TEM and RBS results showed no ion-beam mixing between Fe and SiOC after 473 and 673 K irradiation and a very trivial amount of ion-beam mixing (~2 nm) after 298 K irradiation. At irradiation temperatures higher than 873 K, the Fe marker layer broke down and RBS could no longer be used to quantitatively examine the amount of ion mixing. The results indicate that the Fe/SiOC nanocomposite is thermally stable and tends to demix in the temperature range from 473 to 673 K. For application of this composite structure at temperatures of 873 K or higher, layer stability is a key consideration. |
topic |
radiation tolerant materials amorphous SiOC nanocrystalline Fe amorphous/crystalline interface |
url |
http://www.mdpi.com/2075-4701/6/11/261 |
work_keys_str_mv |
AT qingsu temperaturedependentheliumionbeammixinginanamorphoussioccrystallinefecomposite AT lloydprice temperaturedependentheliumionbeammixinginanamorphoussioccrystallinefecomposite AT linshao temperaturedependentheliumionbeammixinginanamorphoussioccrystallinefecomposite AT michaelnastasi temperaturedependentheliumionbeammixinginanamorphoussioccrystallinefecomposite |
_version_ |
1725586620814458880 |