Electron Dynamics in the Core-Excited CS_{2} Molecule Revealed through Resonant Inelastic X-Ray Scattering Spectroscopy

We present an experimental and theoretical study of resonant inelastic x-ray scattering (RIXS) in the carbon disulphide CS_{2} molecule near the sulfur K-absorption edge. We observe a strong evolution of the RIXS spectral profile with the excitation energy tuned below the lowest unoccupied molecular...

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Bibliographic Details
Main Authors: T. Marchenko, S. Carniato, L. Journel, R. Guillemin, E. Kawerk, M. Žitnik, M. Kavčič, K. Bučar, R. Bohinc, M. Petric, V. Vaz da Cruz, F. Gel’mukhanov, M. Simon
Format: Article
Language:English
Published: American Physical Society 2015-08-01
Series:Physical Review X
Online Access:http://doi.org/10.1103/PhysRevX.5.031021
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Summary:We present an experimental and theoretical study of resonant inelastic x-ray scattering (RIXS) in the carbon disulphide CS_{2} molecule near the sulfur K-absorption edge. We observe a strong evolution of the RIXS spectral profile with the excitation energy tuned below the lowest unoccupied molecular orbital (LUMO) absorption resonance. The reason for this is twofold. Reducing the photon energy in the vicinity of the LUMO absorption resonance leads to a relative suppression of the LUMO contribution with respect to the emission signal from the higher unoccupied molecular orbitals, which results in the modulation of the total RIXS profile. At even larger negative photon-energy detuning from the resonance, the excitation-energy dependence of the RIXS profile is dominated by the onset of electron dynamics triggered by a coherent excitation of multiple electronic states. Furthermore, our study demonstrates that in the hard x-ray regime, localization of the S 1s core hole occurs in CS_{2} during the RIXS process because of the orientational dephasing of interference between the waves scattering on the two sulfur atoms. Core-hole localization leads to violation of the symmetry selection rules for the electron transitions observed in the spectra.
ISSN:2160-3308