Electrical Analogy to an Atomic Force Microscope

Electrical Analogy to an Atomic Force Microscope

Several applications of the atomic force microscopy (AFM), such as measurement of soft samples, manipulation with molecules, etc., require mechanical analysis of the AFM probe behavior. In this article we suggest the electrical circuit analogy to AFM cantilever tip motion. Well developed circuit the...

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Bibliographic Details
Main Author:	O. Kucera
Format:	Article
Language:	English
Published:	Spolecnost pro radioelektronicke inzenyrstvi 2010-04-01
Series:	Radioengineering
Subjects:	Atomic Force Microscopy electrical mechanical analogs circuit theory
Online Access:	http://www.radioeng.cz/fulltexts/2010/10_01_168_171.pdf

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