Characterizing the Pixel Footprint of Satellite Albedo Products Derived from MODIS Reflectance in the Heihe River Basin, China

• Main Authors: Jingjing Peng, Qiang Liu, Lizhao Wang, Qinhuo Liu, Wenjie Fan, Meng Lu, Jianguang Wen
• Format: Article
• Language: English
• Published: MDPI AG 2015-05-01
• Series: Remote Sensing
• Subjects: geophysical signal processing; MODIS; albedo; spatial response; point spread function (PSF)
• Online Access: http://www.mdpi.com/2072-4292/7/6/6886

The adjacency effect and non-uniform responses complicate the precise delimitation of the surface support of remote sensing data and their derived products. Thus, modeling spatial response characteristics (SRCs) prior to using remote sensing information has become important. A point spread function (PSF) is typically used to describe the SRCs of the observation cells from remote sensors and is always estimated in a laboratory before the sensor is launched. However, research on the SRCs of high-order remote sensing products derived from the observations remains insufficient, which is an obstacle to converting between multi-scale remote sensing products and validating coarse-resolution products. This study proposed a method that combines simulation and validation to establish SRC models of coarse-resolution albedo products. Two series of commonly used 500-m/1-km resolution albedo products, which are derived from Moderate Resolution Imaging Spectroradiometer (MODIS) reflectance data, were investigated using 30-m albedo products that provide the required sub-pixel information. The analysis proves that the size of the surface support of each albedo pixel is larger than the nominal resolution of the pixel and that the response weight is non-uniformly distributed, with an elliptical Gaussian shape. The proposed methodology is generic and applicable for analyzing the SRCs of other advanced remote sensing products.