Noise in NC-AFM measurements with significant tip–sample interaction

• Main Authors: Jannis Lübbe, Matthias Temmen, Philipp Rahe, Michael Reichling
• Format: Article
• Language: English
• Published: Beilstein-Institut 2016-12-01
• Series: Beilstein Journal of Nanotechnology
• Subjects: amplitude noise; cantilever stiffness; closed loop; detection system noise; frequency shift noise; non-contact atomic force microscopy (NC-AFM); Q-factor; spectral analysis; thermal noise; tip–sample interaction
• Online Access: https://doi.org/10.3762/bjnano.7.181

The frequency shift noise in non-contact atomic force microscopy (NC-AFM) imaging and spectroscopy consists of thermal noise and detection system noise with an additional contribution from amplitude noise if there are significant tip–sample interactions. The total noise power spectral density DΔf(fm) is, however, not just the sum of these noise contributions. Instead its magnitude and spectral characteristics are determined by the strongly non-linear tip–sample interaction, by the coupling between the amplitude and tip–sample distance control loops of the NC-AFM system as well as by the characteristics of the phase locked loop (PLL) detector used for frequency demodulation. Here, we measure DΔf(fm) for various NC-AFM parameter settings representing realistic measurement conditions and compare experimental data to simulations based on a model of the NC-AFM system that includes the tip–sample interaction. The good agreement between predicted and measured noise spectra confirms that the model covers the relevant noise contributions and interactions. Results yield a general understanding of noise generation and propagation in the NC-AFM and provide a quantitative prediction of noise for given experimental parameters. We derive strategies for noise-optimised imaging and spectroscopy and outline a full optimisation procedure for the instrumentation and control loops.