Noise in NC-AFM measurements with significant tip–sample interaction

Noise in NC-AFM measurements with significant tip–sample interaction

The frequency shift noise in non-contact atomic force microscopy (NC-AFM) imaging and spectroscopy consists of thermal noise and detection system noise with an additional contribution from amplitude noise if there are significant tip–sample interactions. The total noise power spectral density DΔf(fm...

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Bibliographic Details
Main Authors: Jannis Lübbe, Matthias Temmen, Philipp Rahe, Michael Reichling
Format: Article
Language:English
Published: Beilstein-Institut 2016-12-01
Series:Beilstein Journal of Nanotechnology
Subjects:
amplitude noise
cantilever stiffness
closed loop
detection system noise
frequency shift noise
non-contact atomic force microscopy (NC-AFM)
Q-factor
spectral analysis
thermal noise
tip–sample interaction
Online Access:https://doi.org/10.3762/bjnano.7.181

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