Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

Harmonic atomic force microscopy (AFM) was employed to discriminate between different materials and to estimate the mixture ratio of the constituent components in nanocomposites. The major influencing factors, namely amplitude feedback set-point, drive frequency and laser spot position along the can...

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Bibliographic Details
Main Authors: Weijie Zhang, Yuhang Chen, Xicheng Xia, Jiaru Chu
Format: Article
Language:English
Published: Beilstein-Institut 2017-12-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atomic force microscopy
harmonic imaging
material discrimination
mixture ratio
nanocomposites
Online Access:https://doi.org/10.3762/bjnano.8.276

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