Rendering Ti3C2Tx (MXene) monolayers visible

Rendering Ti3C2Tx (MXene) monolayers visible

Herein we report on how to render Ti3C2Tx (MXene) monolayers deposited on SiO2/Si wafers, with different SiO2 thicknesses, visible. Inputting the effective thickness of a Ti3C2Tx monolayer (1 ± 0.2 nm) measured by atomic force microscopy, and its refractive index into a Fresnel-law-based simulation...

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Bibliographic Details
Main Authors: A. Miranda, J. Halim, A. Lorke, M. W. Barsoum
Format: Article
Language:English
Published: Taylor & Francis Group 2017-09-01
Series:Materials Research Letters
Subjects:
Optical microscope
optical properties
MXene monolayers
visibility
Online Access:http://dx.doi.org/10.1080/21663831.2017.1280707
Description
Summary:Herein we report on how to render Ti3C2Tx (MXene) monolayers deposited on SiO2/Si wafers, with different SiO2 thicknesses, visible. Inputting the effective thickness of a Ti3C2Tx monolayer (1 ± 0.2 nm) measured by atomic force microscopy, and its refractive index into a Fresnel-law-based simulation software, we show that the optical contrast of Ti3C2Tx monolayers deposited on SiO2/Si wafers depends on the SiO2 thickness, number of MXene layers, and the light’s wavelength. The highest contrast was found for SiO2 thicknesses around 220 nm. Simulations for other substrates, namely, Al2O3/Si, HfO2/Si, Si3N4/Si and Al2O3/Al, are presented as supplementary information.
ISSN:2166-3831

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