Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy

Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy

Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic...

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Bibliographic Details
Main Authors: Hua Kang, Xiaoqin Qian, Li Guan, Meining Zhang, Qiang Li, Aoli Wu, Mingdong Dong
Format: Article
Language:English
Published: SpringerOpen 2018-01-01
Series:Nanoscale Research Letters
Subjects:
Adhesion Force
Glass Transition Temperature
Polystyrene
Atomic Force Microscope (AFM); Force Distance Curves
Online Access:http://link.springer.com/article/10.1186/s11671-017-2426-9

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http://link.springer.com/article/10.1186/s11671-017-2426-9

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