Design of Substrate-Integrated Waveguide Loading Multiple Complementary Open Resonant Rings (CSRRs) for Dielectric Constant Measurement

In order to solve the low-sensitivity problem of the dielectric constant with the resonant cavity method, a sensor based on a substrate-integrated waveguide structure loaded with a multi-complementary open resonant ring is proposed. With the enhanced resonance characteristics of the sensor, this des...

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Main Authors: Honggang Hao, Dexu Wang, Zhu Wang
Format: Article
Language:English
Published: MDPI AG 2020-02-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/20/3/857
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spelling doaj-e53bf4c8102b40779bd1c9a3a91ed7aa2020-11-25T01:45:50ZengMDPI AGSensors1424-82202020-02-0120385710.3390/s20030857s20030857Design of Substrate-Integrated Waveguide Loading Multiple Complementary Open Resonant Rings (CSRRs) for Dielectric Constant MeasurementHonggang Hao0Dexu Wang1Zhu Wang2College of Electronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, ChinaCollege of Electronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, ChinaCollege of Electronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, ChinaIn order to solve the low-sensitivity problem of the dielectric constant with the resonant cavity method, a sensor based on a substrate-integrated waveguide structure loaded with a multi-complementary open resonant ring is proposed. With the enhanced resonance characteristics of the sensor, this design realized the measurement of complex dielectric constants in a wide range. The frequency selectivity of the sensor is improved by the high-quality factor of the substrate-integrated waveguide. By loading three complementary resonant rings with different opening directions in the ground plane, a deeper notch and better out-of-band suppression are achieved. The effect of the complex dielectric constant on both resonant frequency and quality factor is discussed by calculating the material under test with a known dielectric constant. Simulation and experimental results show that a resonance frequency offset of 102 MHz for the per unit dielectric constant is achieved. A wide frequency offset is the prerequisite for accurate measurement. The measurement results of four plates match well with the standard values, with a relative error of the real part of the dielectric constant of less than 2% and an error of less than 0.0099 for the imaginary part.https://www.mdpi.com/1424-8220/20/3/857dielectric constantcavitysubstrate-integrated waveguidecomplementary open resonant ringsensor
collection DOAJ
language English
format Article
sources DOAJ
author Honggang Hao
Dexu Wang
Zhu Wang
spellingShingle Honggang Hao
Dexu Wang
Zhu Wang
Design of Substrate-Integrated Waveguide Loading Multiple Complementary Open Resonant Rings (CSRRs) for Dielectric Constant Measurement
Sensors
dielectric constant
cavity
substrate-integrated waveguide
complementary open resonant ring
sensor
author_facet Honggang Hao
Dexu Wang
Zhu Wang
author_sort Honggang Hao
title Design of Substrate-Integrated Waveguide Loading Multiple Complementary Open Resonant Rings (CSRRs) for Dielectric Constant Measurement
title_short Design of Substrate-Integrated Waveguide Loading Multiple Complementary Open Resonant Rings (CSRRs) for Dielectric Constant Measurement
title_full Design of Substrate-Integrated Waveguide Loading Multiple Complementary Open Resonant Rings (CSRRs) for Dielectric Constant Measurement
title_fullStr Design of Substrate-Integrated Waveguide Loading Multiple Complementary Open Resonant Rings (CSRRs) for Dielectric Constant Measurement
title_full_unstemmed Design of Substrate-Integrated Waveguide Loading Multiple Complementary Open Resonant Rings (CSRRs) for Dielectric Constant Measurement
title_sort design of substrate-integrated waveguide loading multiple complementary open resonant rings (csrrs) for dielectric constant measurement
publisher MDPI AG
series Sensors
issn 1424-8220
publishDate 2020-02-01
description In order to solve the low-sensitivity problem of the dielectric constant with the resonant cavity method, a sensor based on a substrate-integrated waveguide structure loaded with a multi-complementary open resonant ring is proposed. With the enhanced resonance characteristics of the sensor, this design realized the measurement of complex dielectric constants in a wide range. The frequency selectivity of the sensor is improved by the high-quality factor of the substrate-integrated waveguide. By loading three complementary resonant rings with different opening directions in the ground plane, a deeper notch and better out-of-band suppression are achieved. The effect of the complex dielectric constant on both resonant frequency and quality factor is discussed by calculating the material under test with a known dielectric constant. Simulation and experimental results show that a resonance frequency offset of 102 MHz for the per unit dielectric constant is achieved. A wide frequency offset is the prerequisite for accurate measurement. The measurement results of four plates match well with the standard values, with a relative error of the real part of the dielectric constant of less than 2% and an error of less than 0.0099 for the imaginary part.
topic dielectric constant
cavity
substrate-integrated waveguide
complementary open resonant ring
sensor
url https://www.mdpi.com/1424-8220/20/3/857
work_keys_str_mv AT hongganghao designofsubstrateintegratedwaveguideloadingmultiplecomplementaryopenresonantringscsrrsfordielectricconstantmeasurement
AT dexuwang designofsubstrateintegratedwaveguideloadingmultiplecomplementaryopenresonantringscsrrsfordielectricconstantmeasurement
AT zhuwang designofsubstrateintegratedwaveguideloadingmultiplecomplementaryopenresonantringscsrrsfordielectricconstantmeasurement
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