Thickness dependence of electrical conductivity and thermo-electric power of Bi2.0Te2.7Se0.3/Bi0.4Te3.0Sb1.6 thermo-electric devices
The electrical and thermo-electric (TE) properties of the bismuth telluride (BiTe) -based two-dimensional (2D) thermoelectric (TE) devices with different thin film thicknesses are analyzed systematically. The studied thin film thicknesses are covered from 100 nm to 400 nm. The accurate measured syst...
Main Authors: | M.-H. Liao, K.-C. Huang, F.-A. Tsai, C.-Y. Liu, C. Lien, M.-H. Lee |
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Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2018-01-01
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Series: | AIP Advances |
Online Access: | http://dx.doi.org/10.1063/1.5017252 |
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