Algorithm for automated visual inspection of MMIC using a classifier based on neural networks

Algorithm for automated visual inspection of MMIC using a classifier based on neural networks

We present the algorithm for automated visual inspection of microwave monolithic integrated circuits (MMIC) using computer vision and artificial neural networks. The artificial neural network classifies each pixel of a microphotograph to a certain photomask area. The algorithm detects defectiveness...

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Main Authors: Shiryaev Boris, Bezruk Aleksey, Argunov Dmitry, Yushchenko Aleksey
Format: Article
Language:English
Published: EDP Sciences 2019-01-01
Series:ITM Web of Conferences
Online Access:https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_04012.pdf
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spelling doaj-e7608fe965c14729ac60dbb8ba7d8ed52021-02-02T03:29:02ZengEDP SciencesITM Web of Conferences2271-20972019-01-01300401210.1051/itmconf/20193004012itmconf_crimico2019_04012Algorithm for automated visual inspection of MMIC using a classifier based on neural networksShiryaev BorisBezruk Aleksey0Argunov DmitryYushchenko Aleksey1Joint-stock Company “Research Institute of Semiconductor Devices”Joint-stock Company “Research Institute of Semiconductor Devices”We present the algorithm for automated visual inspection of microwave monolithic integrated circuits (MMIC) using computer vision and artificial neural networks. The artificial neural network classifies each pixel of a microphotograph to a certain photomask area. The algorithm detects defectiveness of an MMIC according to classification result and photomask comparison.https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_04012.pdf
collection DOAJ
language English
format Article
sources DOAJ
author Shiryaev Boris
Bezruk Aleksey
Argunov Dmitry
Yushchenko Aleksey
spellingShingle Shiryaev Boris
Bezruk Aleksey
Argunov Dmitry
Yushchenko Aleksey
Algorithm for automated visual inspection of MMIC using a classifier based on neural networks
ITM Web of Conferences
author_facet Shiryaev Boris
Bezruk Aleksey
Argunov Dmitry
Yushchenko Aleksey
author_sort Shiryaev Boris
title Algorithm for automated visual inspection of MMIC using a classifier based on neural networks
title_short Algorithm for automated visual inspection of MMIC using a classifier based on neural networks
title_full Algorithm for automated visual inspection of MMIC using a classifier based on neural networks
title_fullStr Algorithm for automated visual inspection of MMIC using a classifier based on neural networks
title_full_unstemmed Algorithm for automated visual inspection of MMIC using a classifier based on neural networks
title_sort algorithm for automated visual inspection of mmic using a classifier based on neural networks
publisher EDP Sciences
series ITM Web of Conferences
issn 2271-2097
publishDate 2019-01-01
description We present the algorithm for automated visual inspection of microwave monolithic integrated circuits (MMIC) using computer vision and artificial neural networks. The artificial neural network classifies each pixel of a microphotograph to a certain photomask area. The algorithm detects defectiveness of an MMIC according to classification result and photomask comparison.
url https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_04012.pdf
work_keys_str_mv AT shiryaevboris algorithmforautomatedvisualinspectionofmmicusingaclassifierbasedonneuralnetworks
AT bezrukaleksey algorithmforautomatedvisualinspectionofmmicusingaclassifierbasedonneuralnetworks
AT argunovdmitry algorithmforautomatedvisualinspectionofmmicusingaclassifierbasedonneuralnetworks
AT yushchenkoaleksey algorithmforautomatedvisualinspectionofmmicusingaclassifierbasedonneuralnetworks
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