Algorithm for automated visual inspection of MMIC using a classifier based on neural networks
We present the algorithm for automated visual inspection of microwave monolithic integrated circuits (MMIC) using computer vision and artificial neural networks. The artificial neural network classifies each pixel of a microphotograph to a certain photomask area. The algorithm detects defectiveness...
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EDP Sciences
2019-01-01
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Online Access: | https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_04012.pdf |
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doaj-e7608fe965c14729ac60dbb8ba7d8ed52021-02-02T03:29:02ZengEDP SciencesITM Web of Conferences2271-20972019-01-01300401210.1051/itmconf/20193004012itmconf_crimico2019_04012Algorithm for automated visual inspection of MMIC using a classifier based on neural networksShiryaev BorisBezruk Aleksey0Argunov DmitryYushchenko Aleksey1Joint-stock Company “Research Institute of Semiconductor Devices”Joint-stock Company “Research Institute of Semiconductor Devices”We present the algorithm for automated visual inspection of microwave monolithic integrated circuits (MMIC) using computer vision and artificial neural networks. The artificial neural network classifies each pixel of a microphotograph to a certain photomask area. The algorithm detects defectiveness of an MMIC according to classification result and photomask comparison.https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_04012.pdf |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Shiryaev Boris Bezruk Aleksey Argunov Dmitry Yushchenko Aleksey |
spellingShingle |
Shiryaev Boris Bezruk Aleksey Argunov Dmitry Yushchenko Aleksey Algorithm for automated visual inspection of MMIC using a classifier based on neural networks ITM Web of Conferences |
author_facet |
Shiryaev Boris Bezruk Aleksey Argunov Dmitry Yushchenko Aleksey |
author_sort |
Shiryaev Boris |
title |
Algorithm for automated visual inspection of MMIC using a classifier based on neural networks |
title_short |
Algorithm for automated visual inspection of MMIC using a classifier based on neural networks |
title_full |
Algorithm for automated visual inspection of MMIC using a classifier based on neural networks |
title_fullStr |
Algorithm for automated visual inspection of MMIC using a classifier based on neural networks |
title_full_unstemmed |
Algorithm for automated visual inspection of MMIC using a classifier based on neural networks |
title_sort |
algorithm for automated visual inspection of mmic using a classifier based on neural networks |
publisher |
EDP Sciences |
series |
ITM Web of Conferences |
issn |
2271-2097 |
publishDate |
2019-01-01 |
description |
We present the algorithm for automated visual inspection of microwave monolithic integrated circuits (MMIC) using computer vision and artificial neural networks. The artificial neural network classifies each pixel of a microphotograph to a certain photomask area. The algorithm detects defectiveness of an MMIC according to classification result and photomask comparison. |
url |
https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_04012.pdf |
work_keys_str_mv |
AT shiryaevboris algorithmforautomatedvisualinspectionofmmicusingaclassifierbasedonneuralnetworks AT bezrukaleksey algorithmforautomatedvisualinspectionofmmicusingaclassifierbasedonneuralnetworks AT argunovdmitry algorithmforautomatedvisualinspectionofmmicusingaclassifierbasedonneuralnetworks AT yushchenkoaleksey algorithmforautomatedvisualinspectionofmmicusingaclassifierbasedonneuralnetworks |
_version_ |
1724307646120460288 |