Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers
The scenario of instrument transformers has radically changed from the introduction of the Low-Power version, both passive and active. The latter type, typically referred to as Electronic Instrument Transformers (EITs), has no dedicated standard within the IEC 61869 series yet. To this purpose, in t...
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doaj-e94d0bac28db4115a0dcac06ad4f5c2b2020-11-25T03:26:23ZengMDPI AGSensors1424-82202020-07-01204061406110.3390/s20144061Toward the Standardization of Limits to Offset and Noise in Electronic Instrument TransformersAlessandro Mingotti0Lorenzo Peretto1Roberto Tinarelli2Department of Electrical, Electronic and Information Engineering, Guglielmo Marconi Alma Mater Studiorum, University of Bologna, Viale del Risorgimento 2, 40136 Bologna, ItalyDepartment of Electrical, Electronic and Information Engineering, Guglielmo Marconi Alma Mater Studiorum, University of Bologna, Viale del Risorgimento 2, 40136 Bologna, ItalyDepartment of Electrical, Electronic and Information Engineering, Guglielmo Marconi Alma Mater Studiorum, University of Bologna, Viale del Risorgimento 2, 40136 Bologna, ItalyThe scenario of instrument transformers has radically changed from the introduction of the Low-Power version, both passive and active. The latter type, typically referred to as Electronic Instrument Transformers (EITs), has no dedicated standard within the IEC 61869 series yet. To this purpose, in the authors’ opinion, it is worth understanding how the limits of typical disturbances affecting EITs should be standardized. In particular, after a brief review of the standards, the work presented a mathematical approach to determine the sources of signal disturbances influence, which affect the rms value, on the ratio error. From the results, we discussed that the emergence of disturbances generated within the EIT is a critical aspect to be studied with data of typical off-the-shelf devices. Therefore, to guarantee a correct operation of the devices, a proper standardization of the sources of disturbance should be provided.https://www.mdpi.com/1424-8220/20/14/4061electronic instrument transformeroffsetnoisestandardsaccuracysensors |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Alessandro Mingotti Lorenzo Peretto Roberto Tinarelli |
spellingShingle |
Alessandro Mingotti Lorenzo Peretto Roberto Tinarelli Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers Sensors electronic instrument transformer offset noise standards accuracy sensors |
author_facet |
Alessandro Mingotti Lorenzo Peretto Roberto Tinarelli |
author_sort |
Alessandro Mingotti |
title |
Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers |
title_short |
Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers |
title_full |
Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers |
title_fullStr |
Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers |
title_full_unstemmed |
Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers |
title_sort |
toward the standardization of limits to offset and noise in electronic instrument transformers |
publisher |
MDPI AG |
series |
Sensors |
issn |
1424-8220 |
publishDate |
2020-07-01 |
description |
The scenario of instrument transformers has radically changed from the introduction of the Low-Power version, both passive and active. The latter type, typically referred to as Electronic Instrument Transformers (EITs), has no dedicated standard within the IEC 61869 series yet. To this purpose, in the authors’ opinion, it is worth understanding how the limits of typical disturbances affecting EITs should be standardized. In particular, after a brief review of the standards, the work presented a mathematical approach to determine the sources of signal disturbances influence, which affect the rms value, on the ratio error. From the results, we discussed that the emergence of disturbances generated within the EIT is a critical aspect to be studied with data of typical off-the-shelf devices. Therefore, to guarantee a correct operation of the devices, a proper standardization of the sources of disturbance should be provided. |
topic |
electronic instrument transformer offset noise standards accuracy sensors |
url |
https://www.mdpi.com/1424-8220/20/14/4061 |
work_keys_str_mv |
AT alessandromingotti towardthestandardizationoflimitstooffsetandnoiseinelectronicinstrumenttransformers AT lorenzoperetto towardthestandardizationoflimitstooffsetandnoiseinelectronicinstrumenttransformers AT robertotinarelli towardthestandardizationoflimitstooffsetandnoiseinelectronicinstrumenttransformers |
_version_ |
1724593080866177024 |