Scanning transmission helium ion microscopy on carbon nanomembranes

• Main Authors: Daniel Emmrich, Annalena Wolff, Nikolaus Meyerbröker, Jörg K. N. Lindner, André Beyer, Armin Gölzhäuser
• Format: Article
• Language: English
• Published: Beilstein-Institut 2021-02-01
• Series: Beilstein Journal of Nanotechnology
• Subjects: carbon nanomembranes; dark field; helium ion microscopy (him); scanning transmission ion microscopy (stim); srim simulations
• Online Access: https://doi.org/10.3762/bjnano.12.18

A dark-field scanning transmission ion microscopy detector was designed for the helium ion microscope. The detection principle is based on a secondary electron conversion holder with an exchangeable aperture strip allowing its acceptance angle to be tuned from 3 to 98 mrad. The contrast mechanism and performance were investigated using freestanding nanometer-thin carbon membranes. The results demonstrate that the detector can be optimized either for most efficient signal collection or for maximum image contrast. The designed setup allows for the imaging of thin low-density materials that otherwise provide little signal or contrast and for a clear end-point detection in the fabrication of nanopores. In addition, the detector is able to determine the thickness of membranes with sub-nanometer precision by quantitatively evaluating the image signal and comparing the results with Monte Carlo simulations. The thickness determined by the dark-field transmission detector is compared to X-ray photoelectron spectroscopy and energy-filtered transmission electron microscopy measurements.