Effectiveness of Electrical and Optical Detection at Pixel Circuit on Thin-Film Transistors

Effectiveness of Electrical and Optical Detection at Pixel Circuit on Thin-Film Transistors

The paper presents a typology of electrical open and short defects on thin-film transistors (TFT) using an electrical tester and automatic optical inspection (AOI). The experiment takes the glass 8.5th generation to detect the electrical characteristics engaged with time delay and integration (TDI)...

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Bibliographic Details
Main Author:	Fu-Ming Tzu
Format:	Article
Language:	English
Published:	MDPI AG 2021-01-01
Series:	Micromachines
Subjects:	open and short defect pixel circuit thin-film transistor automatic optical inspection
Online Access:	https://www.mdpi.com/2072-666X/12/2/135

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