A new test vector optimization method for failure isolation

• Main Authors: Jiang Jueyi, Li Fan, Li Jianhong
• Format: Article
• Language: zho
• Published: National Computer System Engineering Research Institute of China 2018-09-01
• Series: Dianzi Jishu Yingyong
• Subjects: test vector; testability modeling; fault isolation
• Online Access: http://www.chinaaet.com/article/3000090960

In order to improve the fault diagnosis efficiency and shorten the fault isolation time based on the testability modeling, a test vector optimization method is proposed. Aiming at the exact detection and isolation requirements of each failure mode in the D matrix, a detailed calculation procedure of the test vector optimization is given，to obtain the test vector with the least number of tests and the shortest calculating time. Both simulation and realistic data experimental results show that the test vector optimization in this paper has fast calculation speed and good optimization effect. It is suitable for large-scale D-matrix applications and can effectively support the fault diagnosis and isolation design for complex systems.