Compositional, Structural, Morphological, and Optical Properties of ZnO Thin Films Prepared by PECVD Technique
ZnO thin films were synthesized on silicon and glass substrates using the plasma-enhanced chemical vapor deposition (PECVD) technique. Three samples were prepared at substrates temperatures of 200, 300, and 400 °C. The surface chemical composition was analyzed by the use of X-Ray Photoelectron spect...
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doaj-ee2427f19e4245bf926a7994313619af2021-02-11T00:00:26ZengMDPI AGCoatings2079-64122021-02-011120220210.3390/coatings11020202Compositional, Structural, Morphological, and Optical Properties of ZnO Thin Films Prepared by PECVD TechniqueNoureddine Hacini0Mostefa Ghamnia1Mohamed Amine Dahamni2Abdelwaheb Boukhachem3Jean-Jacques Pireaux4Laurent Houssiau5Laboratoire des Sciences de la Matière Condensée (LSMC), Université Oran 1 Ahmed Ben Bella, Oran 31100, AlgeriaLaboratoire des Sciences de la Matière Condensée (LSMC), Université Oran 1 Ahmed Ben Bella, Oran 31100, AlgeriaLaboratoire des Sciences de la Matière Condensée (LSMC), Université Oran 1 Ahmed Ben Bella, Oran 31100, AlgeriaUnité de Physique des Dispositifs à Semi-conducteurs, Faculté des Sciences de Tunis, Université de Tunis El Manar, Tunis 2092, TunisiaLISE Laboratory, (NISM-LISE), Namur Institute of Structured Matter, Université de Namur, 5000 Namur, BelgiumLISE Laboratory, (NISM-LISE), Namur Institute of Structured Matter, Université de Namur, 5000 Namur, BelgiumZnO thin films were synthesized on silicon and glass substrates using the plasma-enhanced chemical vapor deposition (PECVD) technique. Three samples were prepared at substrates temperatures of 200, 300, and 400 °C. The surface chemical composition was analyzed by the use of X-Ray Photoelectron spectroscopy (XPS). Structural and morphological properties were studied by using X-ray diffraction (XRD) and scanning electron microscopy (SEM). Optical properties were carried out by UV-visible spectroscopy. XPS spectra showed typical peaks of Zn(2p3/2), Zn(2p1/2), and O(1s) of ZnO with a slight shift attributed to the substrate temperature. XRD analysis revealed hexagonal wurtzite phases with a preferred (002) growth orientation that improved with temperature. Calculation of grain size and dislocation density revealed the crystallization improvement of ZnO when the substrate temperature varied from 200 to 400 °C. SEM images of ZnO films showed textured surfaces composed of grains of spherical shape uniformly distributed. The transmittance yields are reaching 80%, and the values of the band-gap energy indicate that the ZnO films prepared by PECVD present transparent and semiconducting properties.https://www.mdpi.com/2079-6412/11/2/202ZnOPECVDXPSgrain sizetransmittance |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Noureddine Hacini Mostefa Ghamnia Mohamed Amine Dahamni Abdelwaheb Boukhachem Jean-Jacques Pireaux Laurent Houssiau |
spellingShingle |
Noureddine Hacini Mostefa Ghamnia Mohamed Amine Dahamni Abdelwaheb Boukhachem Jean-Jacques Pireaux Laurent Houssiau Compositional, Structural, Morphological, and Optical Properties of ZnO Thin Films Prepared by PECVD Technique Coatings ZnO PECVD XPS grain size transmittance |
author_facet |
Noureddine Hacini Mostefa Ghamnia Mohamed Amine Dahamni Abdelwaheb Boukhachem Jean-Jacques Pireaux Laurent Houssiau |
author_sort |
Noureddine Hacini |
title |
Compositional, Structural, Morphological, and Optical Properties of ZnO Thin Films Prepared by PECVD Technique |
title_short |
Compositional, Structural, Morphological, and Optical Properties of ZnO Thin Films Prepared by PECVD Technique |
title_full |
Compositional, Structural, Morphological, and Optical Properties of ZnO Thin Films Prepared by PECVD Technique |
title_fullStr |
Compositional, Structural, Morphological, and Optical Properties of ZnO Thin Films Prepared by PECVD Technique |
title_full_unstemmed |
Compositional, Structural, Morphological, and Optical Properties of ZnO Thin Films Prepared by PECVD Technique |
title_sort |
compositional, structural, morphological, and optical properties of zno thin films prepared by pecvd technique |
publisher |
MDPI AG |
series |
Coatings |
issn |
2079-6412 |
publishDate |
2021-02-01 |
description |
ZnO thin films were synthesized on silicon and glass substrates using the plasma-enhanced chemical vapor deposition (PECVD) technique. Three samples were prepared at substrates temperatures of 200, 300, and 400 °C. The surface chemical composition was analyzed by the use of X-Ray Photoelectron spectroscopy (XPS). Structural and morphological properties were studied by using X-ray diffraction (XRD) and scanning electron microscopy (SEM). Optical properties were carried out by UV-visible spectroscopy. XPS spectra showed typical peaks of Zn(2p3/2), Zn(2p1/2), and O(1s) of ZnO with a slight shift attributed to the substrate temperature. XRD analysis revealed hexagonal wurtzite phases with a preferred (002) growth orientation that improved with temperature. Calculation of grain size and dislocation density revealed the crystallization improvement of ZnO when the substrate temperature varied from 200 to 400 °C. SEM images of ZnO films showed textured surfaces composed of grains of spherical shape uniformly distributed. The transmittance yields are reaching 80%, and the values of the band-gap energy indicate that the ZnO films prepared by PECVD present transparent and semiconducting properties. |
topic |
ZnO PECVD XPS grain size transmittance |
url |
https://www.mdpi.com/2079-6412/11/2/202 |
work_keys_str_mv |
AT noureddinehacini compositionalstructuralmorphologicalandopticalpropertiesofznothinfilmspreparedbypecvdtechnique AT mostefaghamnia compositionalstructuralmorphologicalandopticalpropertiesofznothinfilmspreparedbypecvdtechnique AT mohamedaminedahamni compositionalstructuralmorphologicalandopticalpropertiesofznothinfilmspreparedbypecvdtechnique AT abdelwahebboukhachem compositionalstructuralmorphologicalandopticalpropertiesofznothinfilmspreparedbypecvdtechnique AT jeanjacquespireaux compositionalstructuralmorphologicalandopticalpropertiesofznothinfilmspreparedbypecvdtechnique AT laurenthoussiau compositionalstructuralmorphologicalandopticalpropertiesofznothinfilmspreparedbypecvdtechnique |
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