Transverse profile imager for ultrabright electron beams

• Main Authors: Rasmus Ischebeck, Eduard Prat, Vincent Thominet, Cigdem Ozkan Loch
• Format: Article
• Language: English
• Published: American Physical Society 2015-08-01
• Series: Physical Review Special Topics. Accelerators and Beams
• Online Access: http://doi.org/10.1103/PhysRevSTAB.18.082802

A transverse profile imager for ultrabright electron beams is presented, which overcomes resolution issues in present designs by observing the Scheimpflug imaging condition as well as the Snell-Descartes law of refraction in the scintillating crystal. Coherent optical transition radiation emitted by highly compressed electron bunches on the surface of the crystal is directed away from the camera, allowing to use the monitor for profile measurements of electron bunches suitable for X-ray free electron lasers. The optical design has been verified by ray tracing simulations, and the angular dependency of the resolution has been verified experimentally. An instrument according to the presented design principles has been used in the SwissFEL Injector Test Facility, and different scintillator materials have been tested. Measurements in conjunction with a transverse deflecting radiofrequency structure and an array of quadrupole magnets demonstrate a normalized slice emittance of 25 nm in the core of a 30 fC electron beam at a pulse length of 10 ps and a particle energy of 230 MeV.