Design of the Synthetic Aperture Microwave Imager Upgrade for measurement of the edge current density on MAST-U
The Synthetic Aperture Microwave Imager (SAMI) has demonstrated the feasibility of 2D Doppler backscattering for measurement of the edge magnetic pitch angle on MAST and NSTX-U. The aim of SAMI-Upgrade (SAMI-U) is to build on this methodology to produce higher quality pitch angle data simultaneously...
Main Authors: | Allen J.O., Vincent C. H., Vann R. G. L. |
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Format: | Article |
Language: | English |
Published: |
EDP Sciences
2019-01-01
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Series: | EPJ Web of Conferences |
Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2019/08/epjconf_ec2018_03004.pdf |
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