Ridge Minimization of Ablated Morphologies on ITO Thin Films Using Squared Quasi-Flat Top Beam

Ridge Minimization of Ablated Morphologies on ITO Thin Films Using Squared Quasi-Flat Top Beam

In this study, we explore the improvements in pattern quality that was obtained with a femtosecond laser with quasi-flat top beam profiles at the ablated edge of indium tin oxide (ITO) thin films for the patterning of optoelectronic devices. To ablate the ITO thin films, a femtosecond laser is used...

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Bibliographic Details
Main Authors: Hoon-Young Kim, Jin-Woo Jeon, Wonsuk Choi, Young-Gwan Shin, Suk-Young Ji, Sung-Hak Cho
Format: Article
Language:English
Published: MDPI AG 2018-03-01
Series:Materials
Subjects:
femtosecond laser
ITO thin film
slit
ridge minimization
ablation
Online Access:http://www.mdpi.com/1996-1944/11/4/530

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