A Novel Edge Feature Description Method for Blur Detection in Manufacturing Processes

A novel inspection sensor by using an edge feature description (EFD) algorithm based on a support vector machine (SVM) is proposed for industrial inspection of images. This method detects and adaptively segments blurred images by using the proposed algorithm, which uses EFD to effectively classify b...

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Bibliographic Details
Main Author: Tsun-Kuo Lin
Format: Article
Language:English
Published: Hindawi Limited 2016-01-01
Series:Journal of Sensors
Online Access:http://dx.doi.org/10.1155/2016/6506249