A Low Redundancy Wavelet Entropy Edge Detection Algorithm

Fast edge detection of images can be useful for many real-world applications. Edge detection is not an end application but often the first step of a computer vision application. Therefore, fast and simple edge detection techniques are important for efficient image processing. In this work, we propos...

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Bibliographic Details
Main Authors: Yiting Tao, Thomas Scully, Asanka G. Perera, Andrew Lambert, Javaan Chahl
Format: Article
Language:English
Published: MDPI AG 2021-09-01
Series:Journal of Imaging
Subjects:
Online Access:https://www.mdpi.com/2313-433X/7/9/188
Description
Summary:Fast edge detection of images can be useful for many real-world applications. Edge detection is not an end application but often the first step of a computer vision application. Therefore, fast and simple edge detection techniques are important for efficient image processing. In this work, we propose a new edge detection algorithm using a combination of the wavelet transform, Shannon entropy and thresholding. The new algorithm is based on the concept that each Wavelet decomposition level has an assumed level of structure that enables the use of Shannon entropy as a measure of global image structure. The proposed algorithm is developed mathematically and compared to five popular edge detection algorithms. The results show that our solution is low redundancy, noise resilient, and well suited to real-time image processing applications.
ISSN:2313-433X