A new robust method for two-dimensional inverse filtering

In this paper, we present a novel method for inverse filtering a two dimensional (2-D) signal using phase-based processing techniques. A 2-D sequence can be represented by a sufficient number of samples of the phase of its Fourier transform and its region of support. This is exploited to perform dec...

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Bibliographic Details
Main Authors: Lim, Jae S. (Contributor), Fuller, Megan Marie (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: SPIE, 2016-01-13T18:39:21Z.
Subjects:
Online Access:Get fulltext
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100 1 0 |a Lim, Jae S.  |e author 
100 1 0 |a Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science  |e contributor 
100 1 0 |a Massachusetts Institute of Technology. Research Laboratory of Electronics  |e contributor 
100 1 0 |a Fuller, Megan Marie  |e contributor 
100 1 0 |a Lim, Jae S.  |e contributor 
700 1 0 |a Fuller, Megan Marie  |e author 
245 0 0 |a A new robust method for two-dimensional inverse filtering 
260 |b SPIE,   |c 2016-01-13T18:39:21Z. 
856 |z Get fulltext  |u http://hdl.handle.net/1721.1/100816 
520 |a In this paper, we present a novel method for inverse filtering a two dimensional (2-D) signal using phase-based processing techniques. A 2-D sequence can be represented by a sufficient number of samples of the phase of its Fourier transform and its region of support. This is exploited to perform deconvolution. We examine the effects of additive noise and incomplete knowledge of the point spread function on the performance of this deconvolution method and compare it with other 2-D deconvolution methods. The problem of finding the region of support will also be briefly addressed. Finally, an application example will be presented. 
546 |a en_US 
655 7 |a Article 
773 |t Proceedings of SPIE--the International Society for Optical Engineering