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01557 am a22002293u 4500 |
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120979 |
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|a Yew, Elijah Y. S.
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|a Institute for Medical Engineering and Science
|e contributor
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|a Massachusetts Institute of Technology. Department of Mechanical Engineering
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|a Choi, Heejin
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|a Kim, Daekeun
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|a So, Peter T. C.
|e contributor
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|a Choi, Heejin
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|a Kim, Daekeun
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|a So, Peter T. C.
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|a Wide-field two-photon microscopy with temporal focusing and HiLo background rejection
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|b SPIE,
|c 2019-03-15T14:07:09Z.
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|z Get fulltext
|u http://hdl.handle.net/1721.1/120979
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|a Scanningless depth-resolved microscopy is achieved through spatial-temporal focusing and has been demonstrated previously. The advantage of this method is that a large area may be imaged without scanning resulting in higher throughput of the imaging system. Because it is a widefield technique, the optical sectioning effect is considerably poorer than with conventional spatial focusing two-photon microscopy. Here we propose wide-field two-photon microscopy based on spatio-temporal focusing and employing background rejection based on the HiLo microscope principle. We demonstrate the effects of applying HiLo microscopy to widefield temporally focused two-photon microscopy.
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|a Article
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|t Proceedings of SPIE 7903, Multiphoton Microscopy in the Biomedical Sciences XI
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