Heavy Ion radiation assessment of a 100G/200G commercial optical coherent DSP ASIC

Heavy Ion radiation assessment of a 100G/200G commercial optical coherent DSP ASIC

© 2019 SPIE. Downloading of the abstract is permitted for personal use only. We assess the viability of a state-of-the-art 100G/200G commercial optical coherent DSP ASIC (16 nm FinFET CMOS technology) for space applications through heavy ion testing to (1) screen for destructive SELs and (2) observe...

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Main Authors: Aniceto, Raichelle J. (Author), Milanowski, Randall (Author), McClure, Steve (Author), Aguilar, Alexa (Author), Moro, Slaven (Author), Miller, Eric D. (Author), Cahoy, Kerri (Author), Nicholson, Neal (Author), Greene, Daniel (Author)
Format: Article
Language:English
Published: SPIE, 2021-11-09T15:58:51Z.
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Summary:© 2019 SPIE. Downloading of the abstract is permitted for personal use only. We assess the viability of a state-of-the-art 100G/200G commercial optical coherent DSP ASIC (16 nm FinFET CMOS technology) for space applications through heavy ion testing to (1) screen for destructive SELs and (2) observe for nondestructive heavy ion SEEs on the ASIC. The ASIC was exposed to heavy ion radiation while operating both optically noise-loaded uplink and downlink to an optical and quot;ground" modem. There were no destructive SEEs, such as SELs, observed from the heavy ion radiation test campaign.

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