Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials

Bibliographic Details
Main Authors: Miller, Matthew J. (Author), Cabral, Matthew J. (Author), Dickey, Elizabeth C. (Author), LeBeau, James M. (Author), Reich, Brian J. (Author)
Format: Article
Language:English
Published: Informa UK Limited, 2022-05-31T20:44:33Z.
Subjects:
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