Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials
Main Authors: | Miller, Matthew J. (Author), Cabral, Matthew J. (Author), Dickey, Elizabeth C. (Author), LeBeau, James M. (Author), Reich, Brian J. (Author) |
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Format: | Article |
Language: | English |
Published: |
Informa UK Limited,
2022-05-31T20:44:33Z.
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Subjects: | |
Online Access: | Get fulltext |
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