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|a Degen, Christian
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|a Massachusetts Institute of Technology. Department of Chemistry
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|a Degen, Christian
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|a Degen, Christian
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|a Poggio, M.
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|a Oosterkamp, T. H.
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|a Mamin, H. J.
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|a Rugar, D.
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|a Frequency domain multiplexing of force signals with application to magnetic resonance force microscopy
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|b American Institute of Physics,
|c 2010-10-14T19:01:38Z.
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|z Get fulltext
|u http://hdl.handle.net/1721.1/59335
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|a Frequency domain multiplexing, using an actively damped micromechanical cantilever, is used to detect multiple force signals simultaneously. The measurement principle is applied to magnetic resonance force microscopy to allow concurrent measurement of nuclear spin signals originating from distinct regions of the sample, or from multiple spin species.
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|a European Research Council
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|a National Science Foundation (U.S.)
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|a Stanford University. Center for Probing the Nanoscale (Grant No. NSF PHY-0425897)
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|a en_US
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|a Article
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|t Applied Physical Letters
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