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67023 |
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|a Post, E. Rehmi
|e author
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|a Massachusetts Institute of Technology. Center for Bits and Atoms
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|a Massachusetts Institute of Technology. Media Laboratory
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|a Massachusetts Institute of Technology. Spectroscopy Laboratory
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|a Program in Media Arts and Sciences
|q (Massachusetts Institute of Technology)
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|a Gershenfeld, Neil
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|a Post, E. Rehmi
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|a Popescu, Gabriel
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|a Gershenfeld, Neil
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|a Popescu, Gabriel
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|a Gershenfeld, Neil A
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|a Inertial measurement with trapped particles: A microdynamical system
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|b American Institute of Physics,
|c 2011-11-14T22:14:08Z.
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|z Get fulltext
|u http://hdl.handle.net/1721.1/67023
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|a We describe an inertial measurement device based on an electrodynamically trapped proof mass. Mechanical constraints are replaced by guiding fields, permitting the trap stiffness to be tuned dynamically. Optical readout of the proof mass motion provides a measurement of acceleration and rotation, resulting in an integrated six degree of freedom inertial measurement device. We demonstrate such a device-constructed without microfabrication-with sensitivity comparable to that of commercial microelectromechanical systems technology and show how trapping parameters may be adjusted to increase dynamic range.
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|a National Science Foundation (U.S.) (NSF under Grant No. CCR-0122419)
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|a Massachusetts Institute of Technology. Center for Bits and Atoms
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|a en_US
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|a Article
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|t Applied Physics Letters
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