Efficient authentication scheme for data aggregation in smart grid with fault tolerance and fault diagnosis
Authentication schemes relying on per-packet signature and per-signature verification introduce heavy cost for computation and communication. Due to its constraint resources, smart grid's authentication requirement cannot be satisfied by this scheme. Most importantly, it is a must to underscore...
Main Authors: | Li, Depeng (Author), Aung, Zeyar (Author), Sanchez, Abel (Contributor), Williams, John R (Author) |
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Other Authors: | Massachusetts Institute of Technology. Auto-ID Laboratory (Contributor), Massachusetts Institute of Technology. Department of Civil and Environmental Engineering (Contributor), Massachusetts Institute of Technology. Laboratory for Manufacturing and Productivity (Contributor), Williams, John R. (Contributor) |
Format: | Article |
Language: | English |
Published: |
Institute of Electrical and Electronics Engineers (IEEE),
2013-03-27T14:38:15Z.
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Subjects: | |
Online Access: | Get fulltext |
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