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80403 |
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|a dc
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|a Lee, Byungkun
|e author
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|a Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
|e contributor
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|a Massachusetts Institute of Technology. Media Laboratory
|e contributor
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|a Massachusetts Institute of Technology. Responsive Environments Group
|e contributor
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|a Program in Media Arts and Sciences
|q (Massachusetts Institute of Technology)
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|a Lee, ByungKun
|e contributor
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|a Aldrich, Matthew Henry
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|a Paradiso, Joseph A.
|e contributor
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|a Aldrich, Matthew Henry
|e author
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|a Lee, ByungKun
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|a Paradiso, Joseph A
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|a Methods for measuring work surface illuminance in adaptive solid state lighting networks
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|b SPIE,
|c 2013-09-11T18:55:39Z.
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|z Get fulltext
|u http://hdl.handle.net/1721.1/80403
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|a The inherent control flexibility implied by solid-state lighting - united with the rich details offered by sensor networks - prompts us to rethink lighting control. In this research, we propose several techniques for measuring work surface illuminance and ambient light using a sensor network. The primary goal of this research is to measure work surface illuminance without distraction to the user. We discuss these techniques, including the lessons learned from our prior research. We present a new method for measuring the illuminance contribution of an arbitrary luminaire at the work surface by decomposing the modulated light into its fundamental and harmonic components.
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|a Massachusetts Institute of Technology. Media Laboratory
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|a en_US
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|a Article
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|t Proceedings of SPIE--the International Society for Optical Engineering; v.8123
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