Effective lifetimes exceeding 300 μs in gettered p-type epitaxial kerfless silicon for photovoltaics

We evaluate defect concentrations and investigate the lifetime potential of p-type single-crystal kerfless silicon produced via epitaxy for photovoltaics. In gettered material, low interstitial iron concentrations (as low as (3.2 ± 2.2) × 10[superscript 9] cm[superscript −3]) suggest that minority-c...

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Bibliographic Details
Main Authors: Powell, D. M. (Contributor), Hao, R. (Author), Ravi, T. S. (Author), Hofstetter, Jasmin (Contributor), Fenning, David P. (Contributor), Buonassisi, Tonio (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: American Institute of Physics (AIP), 2015-06-08T18:58:01Z.
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Online Access:Get fulltext
LEADER 02190 am a22003253u 4500
001 97226
042 |a dc 
100 1 0 |a Powell, D. M.  |e author 
100 1 0 |a Massachusetts Institute of Technology. Department of Mechanical Engineering  |e contributor 
100 1 0 |a Massachusetts Institute of Technology. Research Laboratory of Electronics  |e contributor 
100 1 0 |a Powell, D. M.  |e contributor 
100 1 0 |a Hofstetter, Jasmin  |e contributor 
100 1 0 |a Fenning, David P.  |e contributor 
100 1 0 |a Buonassisi, Tonio  |e contributor 
700 1 0 |a Hao, R.  |e author 
700 1 0 |a Ravi, T. S.  |e author 
700 1 0 |a Hofstetter, Jasmin  |e author 
700 1 0 |a Fenning, David P.  |e author 
700 1 0 |a Buonassisi, Tonio  |e author 
245 0 0 |a Effective lifetimes exceeding 300 μs in gettered p-type epitaxial kerfless silicon for photovoltaics 
260 |b American Institute of Physics (AIP),   |c 2015-06-08T18:58:01Z. 
856 |z Get fulltext  |u http://hdl.handle.net/1721.1/97226 
520 |a We evaluate defect concentrations and investigate the lifetime potential of p-type single-crystal kerfless silicon produced via epitaxy for photovoltaics. In gettered material, low interstitial iron concentrations (as low as (3.2 ± 2.2) × 10[superscript 9] cm[superscript −3]) suggest that minority-carrier lifetime is not limited by dissolved iron. An increase in gettered lifetime from <20 to >300 μs is observed after increasing growth cleanliness. This improvement coincides with reductions in the concentration of Mo, V, Nb, and Cr impurities, but negligible change in the low area-fraction (<5%) of dislocated regions. Device simulations indicate that the high bulk lifetime of this material could support solar cell efficiencies >23%. 
520 |a United States. Dept. of Energy (Contract DE-EE0005314) 
520 |a National Science Foundation (U.S.) (United States. Dept. of Energy NSF CA EEC-1041895) 
520 |a American Society for Engineering Education. National Defense Science and Engineering Graduate Fellowship 
520 |a Alexander von Humboldt-Stiftung (Feodor Lynen Postdoctoral Fellowship) 
546 |a en_US 
655 7 |a Article 
773 |t Applied Physics Letters