Effective lifetimes exceeding 300 μs in gettered p-type epitaxial kerfless silicon for photovoltaics

We evaluate defect concentrations and investigate the lifetime potential of p-type single-crystal kerfless silicon produced via epitaxy for photovoltaics. In gettered material, low interstitial iron concentrations (as low as (3.2 ± 2.2) × 10[superscript 9] cm[superscript −3]) suggest that minority-c...

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Bibliographic Details
Main Authors: Powell, D. M. (Contributor), Hao, R. (Author), Ravi, T. S. (Author), Hofstetter, Jasmin (Contributor), Fenning, David P. (Contributor), Buonassisi, Tonio (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: American Institute of Physics (AIP), 2015-06-08T18:58:01Z.
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Online Access:Get fulltext

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