Single-vortex pinning and penetration depth in superconducting NdFeAsO[subscript 1−x]F[subscript x]

We use a magnetic force microscope (MFM) to investigate single-vortex pinning and penetration depth in NdFeAsO[subscript 1−x]F[subscript x], one of the highest-T[subscript c] iron-based superconductors. In fields up to 20 G, we observe a disordered vortex arrangement, implying that the pinning force...

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Bibliographic Details
Main Authors: Zhang, Jessie T. (Contributor), Kim, Jeehoon (Author), Huefner, Magdalena (Author), Ye, Cun (Author), Kim, Stella (Author), Canfield, Paul C. (Author), Prozorov, Ruslan (Author), Auslaender, Ophir M. (Author), Hoffman, Jennifer E. (Author)
Other Authors: Massachusetts Institute of Technology. Department of Physics (Contributor)
Format: Article
Language:English
Published: American Physical Society, 2015-10-13T11:52:31Z.
Subjects:
Online Access:Get fulltext
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042 |a dc 
100 1 0 |a Zhang, Jessie T.  |e author 
100 1 0 |a Massachusetts Institute of Technology. Department of Physics  |e contributor 
100 1 0 |a Zhang, Jessie T.  |e contributor 
700 1 0 |a Kim, Jeehoon  |e author 
700 1 0 |a Huefner, Magdalena  |e author 
700 1 0 |a Ye, Cun  |e author 
700 1 0 |a Kim, Stella  |e author 
700 1 0 |a Canfield, Paul C.  |e author 
700 1 0 |a Prozorov, Ruslan  |e author 
700 1 0 |a Auslaender, Ophir M.  |e author 
700 1 0 |a Hoffman, Jennifer E.  |e author 
245 0 0 |a Single-vortex pinning and penetration depth in superconducting NdFeAsO[subscript 1−x]F[subscript x] 
260 |b American Physical Society,   |c 2015-10-13T11:52:31Z. 
856 |z Get fulltext  |u http://hdl.handle.net/1721.1/99214 
520 |a We use a magnetic force microscope (MFM) to investigate single-vortex pinning and penetration depth in NdFeAsO[subscript 1−x]F[subscript x], one of the highest-T[subscript c] iron-based superconductors. In fields up to 20 G, we observe a disordered vortex arrangement, implying that the pinning forces are stronger than the vortex-vortex interactions. We measure the typical force to depin a single vortex, F[subscript depin] ≃ 4.5 pN, corresponding to a critical current up to J[subscript c] ≃ 7 × 10[superscript 5] A/cm[superscript 2]. Furthermore, our MFM measurements allow the first local and absolute determination of the superconducting in-plane penetration depth in NdFeAsO[subscript 1−x]F[subscript x],λ[subscript ab] = 320 ± 60 nm, which is larger than previous bulk measurements. 
520 |a Massachusetts Institute of Technology. Undergraduate Research Opportunities Program 
546 |a en 
655 7 |a Article 
773 |t Physical Review B