Scanning tunneling microscopy studies of a reactive interface, Ni/GaAs

Bibliographic Details
Main Author:	Quesenberry, Paul Elwin
Published:	Georgia Institute of Technology 2009
Subjects:	Scanning tunneling microscopy Gas dynamics
Online Access:	http://hdl.handle.net/1853/30779

id	ndltd-GATECH-oai-smartech.gatech.edu-1853-30779
record_format	oai_dc
spelling	ndltd-GATECH-oai-smartech.gatech.edu-1853-307792013-12-15T03:44:42ZScanning tunneling microscopy studies of a reactive interface, Ni/GaAsQuesenberry, Paul ElwinScanning tunneling microscopyGas dynamicsGeorgia Institute of Technology2009-10-22T11:45:33Z2009-10-22T11:45:33Z1996-05Dissertation436830http://hdl.handle.net/1853/30779
collection	NDLTD
sources	NDLTD
topic	Scanning tunneling microscopy Gas dynamics
spellingShingle	Scanning tunneling microscopy Gas dynamics Quesenberry, Paul Elwin Scanning tunneling microscopy studies of a reactive interface, Ni/GaAs
author	Quesenberry, Paul Elwin
author_facet	Quesenberry, Paul Elwin
author_sort	Quesenberry, Paul Elwin
title	Scanning tunneling microscopy studies of a reactive interface, Ni/GaAs
title_short	Scanning tunneling microscopy studies of a reactive interface, Ni/GaAs
title_full	Scanning tunneling microscopy studies of a reactive interface, Ni/GaAs
title_fullStr	Scanning tunneling microscopy studies of a reactive interface, Ni/GaAs
title_full_unstemmed	Scanning tunneling microscopy studies of a reactive interface, Ni/GaAs
title_sort	scanning tunneling microscopy studies of a reactive interface, ni/gaas
publisher	Georgia Institute of Technology
publishDate	2009
url	http://hdl.handle.net/1853/30779
work_keys_str_mv	AT quesenberrypaulelwin scanningtunnelingmicroscopystudiesofareactiveinterfacenigaas
_version_	1716620077557612544

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