Estimativa da incerteza de medição de um sistema utilizado para caracterização eletrônica de materiais semicondutores
Made available in DSpace on 2016-05-11T12:03:15Z (GMT). No. of bitstreams: 1 000478507-Texto+Completo-0.pdf: 3236026 bytes, checksum: 1ef077f1aa686a54c1db1ee1f57a3393 (MD5) Previous issue date: 2015 === The purpose of this paper was to present a case on the application of the classic method for th...
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| Language: | Portuguese |
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Pontifícia Universidade Católica do Rio Grande do Sul
2016
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| Online Access: | http://hdl.handle.net/10923/8218 |