Built-in jitter test schemes for mixed-signal integrated circuits
Recent years have seen an unparalleled growth in the speed and complexity of VLSI circuits. Analog and mixed-signal circuits are going through a resurgence and continue to pose new challenges to VLSI test engineers. The state-of-the-art in the mixed-signal and analog test domain is to use applica...
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| Language: | English |
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2009
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| Online Access: | http://hdl.handle.net/2429/7771 |