Radio frequency identification (RFID) applications in semiconductor manufacturing

• Main Authors: Cassett, David Ian, 1971-, Hopeman, Christopher William Chiu, 1976-
• Other Authors: James B. Rice, Jr.
• Format: Others
• Language: en_US
• Published: Massachusetts Institute of Technology 2005
• Subjects: Engineering Systems Division.
• Online Access: http://hdl.handle.net/1721.1/28503

Thesis (M. Eng. in Logistics)--Massachusetts Institute of Technology, Engineering Systems Division, 2004. === Includes bibliographical references (p. 87). === Radio frequency identification (RFID) has an enormous potential impact within the semiconductor supply chain, especially within semiconductor manufacturing. The end benefit of RFID will be in the mass serialization, and the subsequent tracking and tracing, of individual semiconductors, or what is referred to as Unit Level Traceability (ULT). Before all of the technical hurdles of ULT are overcome, however, there exists a host of other applications for RFID within semiconductor manufacturing. The identification of what can and what should be RFID-tagged and read, the analysis of how to collect this information and what to do with the data, and the implementation of some targeted opportunities will provides valuable information with regards to the technical and logistical hurdles of RFID within semiconductor manufacturing far before ULT becomes a reality. === by David Ian Cassett [and] Christopher William Chiu Hopeman. === M.Eng.in Logistics