Industry dynamics within semiconductor value chain : IDM, foundry and fabless

Thesis (S.M.M.O.T.)--Massachusetts Institute of Technology, Sloan School of Management, Management of Technology Program, 2003. === Includes bibliographical references (leaf 60). === This thesis intends to analyze the semiconductor value chain and identify critical factors, which impact the future i...

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Main Author: Wu, Shih-Lung, 1963-
Other Authors: Charles Fine.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2006
Subjects:
Online Access:http://hdl.handle.net/1721.1/29721
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spelling ndltd-MIT-oai-dspace.mit.edu-1721.1-297212019-05-02T15:33:01Z Industry dynamics within semiconductor value chain : IDM, foundry and fabless Wu, Shih-Lung, 1963- Charles Fine. Massachusetts Institute of Technology. Management of Technology Program. Massachusetts Institute of Technology. Management of Technology Program. Management of Technology Program. Thesis (S.M.M.O.T.)--Massachusetts Institute of Technology, Sloan School of Management, Management of Technology Program, 2003. Includes bibliographical references (leaf 60). This thesis intends to analyze the semiconductor value chain and identify critical factors, which impact the future industry structure. The main focus is in the dynamics among IDM (Integrated Design Manufacture), foundry and fabless companies. This analysis will utilize double helix [1] model with consideration of economics of scale, fixed cost and product life cycle. Furthermore, the cost and time-to-market factors involved in SoC (system-on-chip) and FPGA/PLD development will be explored. Based on the analysis, a tool will be developed to evaluate make-or-buy (developing own SoC or using off-shelf FPGA/PLD) decision. by Shih-Lung Wu. S.M.M.O.T. 2006-03-24T16:18:52Z 2006-03-24T16:18:52Z 2003 2003 Thesis http://hdl.handle.net/1721.1/29721 54038520 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 60 leaves 2718656 bytes 2718465 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology
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language English
format Others
sources NDLTD
topic Management of Technology Program.
spellingShingle Management of Technology Program.
Wu, Shih-Lung, 1963-
Industry dynamics within semiconductor value chain : IDM, foundry and fabless
description Thesis (S.M.M.O.T.)--Massachusetts Institute of Technology, Sloan School of Management, Management of Technology Program, 2003. === Includes bibliographical references (leaf 60). === This thesis intends to analyze the semiconductor value chain and identify critical factors, which impact the future industry structure. The main focus is in the dynamics among IDM (Integrated Design Manufacture), foundry and fabless companies. This analysis will utilize double helix [1] model with consideration of economics of scale, fixed cost and product life cycle. Furthermore, the cost and time-to-market factors involved in SoC (system-on-chip) and FPGA/PLD development will be explored. Based on the analysis, a tool will be developed to evaluate make-or-buy (developing own SoC or using off-shelf FPGA/PLD) decision. === by Shih-Lung Wu. === S.M.M.O.T.
author2 Charles Fine.
author_facet Charles Fine.
Wu, Shih-Lung, 1963-
author Wu, Shih-Lung, 1963-
author_sort Wu, Shih-Lung, 1963-
title Industry dynamics within semiconductor value chain : IDM, foundry and fabless
title_short Industry dynamics within semiconductor value chain : IDM, foundry and fabless
title_full Industry dynamics within semiconductor value chain : IDM, foundry and fabless
title_fullStr Industry dynamics within semiconductor value chain : IDM, foundry and fabless
title_full_unstemmed Industry dynamics within semiconductor value chain : IDM, foundry and fabless
title_sort industry dynamics within semiconductor value chain : idm, foundry and fabless
publisher Massachusetts Institute of Technology
publishDate 2006
url http://hdl.handle.net/1721.1/29721
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