Product strategy in response to technological innovation in the semiconductor test industry

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2004. === Includes bibliographical references (p. 82-84). === After...

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Main Author: Lin, Robert W. (Robert Wei-Pang), 1976-
Other Authors: Charles H. Fine and Daniel E. Whitney.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2006
Subjects:
Online Access:http://hdl.handle.net/1721.1/34793
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spelling ndltd-MIT-oai-dspace.mit.edu-1721.1-347932019-05-02T16:06:31Z Product strategy in response to technological innovation in the semiconductor test industry Lin, Robert W. (Robert Wei-Pang), 1976- Charles H. Fine and Daniel E. Whitney. Leaders for Manufacturing Program. Massachusetts Institute of Technology. Dept. of Mechanical Engineering. Sloan School of Management. Leaders for Manufacturing Program. Mechanical Engineering. Sloan School of Management. Leaders for Manufacturing Program. Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2004. Includes bibliographical references (p. 82-84). After the market boom of 2000 in the semiconductor industry changed significantly. The changes included stricter limits on capital cost spending, and the increased propensity of the industry to outsource the manufacturing of semiconductors. Thus, the semiconductor industry demanded greater cost of test economics in semiconductor test equipment. In response to the changes in the industry and the customer demands, the semiconductor test industry segmented itself into two broad strategies. Typically, the large semiconductor test equipment manufacturers employed a broad platform strategy, while the smaller semiconductor test equipment manufacturers employed a niche platform strategy. This thesis confirms the underlying changes in the semiconductor test industry by looking at the entire semiconductor value chain. It also looks at the root causes of the changes in order to determine the future effects of the changes in the semiconductor test industry. This thesis also analyzes the two distinct market strategies, developing a systematic method to compare and evaluate each strategy. In addition, it explores the intangible risks associated with the adoption of each strategy. After understanding the trends in the semiconductor test industry, this thesis also presents a unified model to discuss the future direction of the semiconductor test industry. Looking at this direction, this project develops specific recommendations for businesses to compete effectively given the impending market conditions. by Robert W. Lin. S.M. 2006-11-08T16:39:11Z 2006-11-08T16:39:11Z 2004 2004 Thesis http://hdl.handle.net/1721.1/34793 56890738 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 84 p. 5197216 bytes 5197024 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology
collection NDLTD
language English
format Others
sources NDLTD
topic Mechanical Engineering.
Sloan School of Management.
Leaders for Manufacturing Program.
spellingShingle Mechanical Engineering.
Sloan School of Management.
Leaders for Manufacturing Program.
Lin, Robert W. (Robert Wei-Pang), 1976-
Product strategy in response to technological innovation in the semiconductor test industry
description Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2004. === Includes bibliographical references (p. 82-84). === After the market boom of 2000 in the semiconductor industry changed significantly. The changes included stricter limits on capital cost spending, and the increased propensity of the industry to outsource the manufacturing of semiconductors. Thus, the semiconductor industry demanded greater cost of test economics in semiconductor test equipment. In response to the changes in the industry and the customer demands, the semiconductor test industry segmented itself into two broad strategies. Typically, the large semiconductor test equipment manufacturers employed a broad platform strategy, while the smaller semiconductor test equipment manufacturers employed a niche platform strategy. This thesis confirms the underlying changes in the semiconductor test industry by looking at the entire semiconductor value chain. It also looks at the root causes of the changes in order to determine the future effects of the changes in the semiconductor test industry. This thesis also analyzes the two distinct market strategies, developing a systematic method to compare and evaluate each strategy. In addition, it explores the intangible risks associated with the adoption of each strategy. After understanding the trends in the semiconductor test industry, this thesis also presents a unified model to discuss the future direction of the semiconductor test industry. Looking at this direction, this project develops specific recommendations for businesses to compete effectively given the impending market conditions. === by Robert W. Lin. === S.M.
author2 Charles H. Fine and Daniel E. Whitney.
author_facet Charles H. Fine and Daniel E. Whitney.
Lin, Robert W. (Robert Wei-Pang), 1976-
author Lin, Robert W. (Robert Wei-Pang), 1976-
author_sort Lin, Robert W. (Robert Wei-Pang), 1976-
title Product strategy in response to technological innovation in the semiconductor test industry
title_short Product strategy in response to technological innovation in the semiconductor test industry
title_full Product strategy in response to technological innovation in the semiconductor test industry
title_fullStr Product strategy in response to technological innovation in the semiconductor test industry
title_full_unstemmed Product strategy in response to technological innovation in the semiconductor test industry
title_sort product strategy in response to technological innovation in the semiconductor test industry
publisher Massachusetts Institute of Technology
publishDate 2006
url http://hdl.handle.net/1721.1/34793
work_keys_str_mv AT linrobertwrobertweipang1976 productstrategyinresponsetotechnologicalinnovationinthesemiconductortestindustry
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