Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998. === Includes bibliographical references (leaves 98-100). === by Steve Gia Dao. === M.S.

Bibliographic Details
Main Author:	Dao, Steve Gia, 1973-
Other Authors:	James Chung.
Format:	Others
Language:	English
Published:	Massachusetts Institute of Technology 2009
Subjects:	Electrical Engineering and Computer Science
Online Access:	http://hdl.handle.net/1721.1/47435

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spelling	ndltd-MIT-oai-dspace.mit.edu-1721.1-474352019-05-02T16:17:39Z Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification Dao, Steve Gia, 1973- James Chung. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998. Includes bibliographical references (leaves 98-100). by Steve Gia Dao. M.S. 2009-10-01T15:10:58Z 2009-10-01T15:10:58Z 1998 1998 Thesis http://hdl.handle.net/1721.1/47435 39134657 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 100 leaves application/pdf Massachusetts Institute of Technology
collection	NDLTD
language	English
format	Others
sources	NDLTD
topic	Electrical Engineering and Computer Science
spellingShingle	Electrical Engineering and Computer Science Dao, Steve Gia, 1973- Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification
description	Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998. === Includes bibliographical references (leaves 98-100). === by Steve Gia Dao. === M.S.
author2	James Chung.
author_facet	James Chung. Dao, Steve Gia, 1973-
author	Dao, Steve Gia, 1973-
author_sort	Dao, Steve Gia, 1973-
title	Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification
title_short	Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification
title_full	Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification
title_fullStr	Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification
title_full_unstemmed	Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification
title_sort	procedure for optimal d.c. parameter extraction for hot-carrier degradation model calibration and verification
publisher	Massachusetts Institute of Technology
publishDate	2009
url	http://hdl.handle.net/1721.1/47435
work_keys_str_mv	AT daostevegia1973 procedureforoptimaldcparameterextractionforhotcarrierdegradationmodelcalibrationandverification
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Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification

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