Balakrishnan, K., & Boning, D. S. (2012). Characterization and analysis of process variability in deeply-scaled MOSFETs. Massachusetts Institute of Technology.
Chicago Style (17th ed.) CitationBalakrishnan, Karthik, and Duane S. Boning. Characterization and Analysis of Process Variability in Deeply-scaled MOSFETs. Massachusetts Institute of Technology, 2012.
MLA (8th ed.) CitationBalakrishnan, Karthik, and Duane S. Boning. Characterization and Analysis of Process Variability in Deeply-scaled MOSFETs. Massachusetts Institute of Technology, 2012.
Warning: These citations may not always be 100% accurate.