APA (7th ed.) Citation

Balakrishnan, K., & Boning, D. S. (2012). Characterization and analysis of process variability in deeply-scaled MOSFETs. Massachusetts Institute of Technology.

Chicago Style (17th ed.) Citation

Balakrishnan, Karthik, and Duane S. Boning. Characterization and Analysis of Process Variability in Deeply-scaled MOSFETs. Massachusetts Institute of Technology, 2012.

MLA (8th ed.) Citation

Balakrishnan, Karthik, and Duane S. Boning. Characterization and Analysis of Process Variability in Deeply-scaled MOSFETs. Massachusetts Institute of Technology, 2012.

Warning: These citations may not always be 100% accurate.