Growth and characterization of thick oriented barium hexaferrite films on MgO (111) substrates

Highly oriented films of BaFe<sub>1</sub><sub>2</sub>O<sub>1</sub><sub>9</sub> have been deposited onto MgO (111) substrates by pulsed laser ablation deposition. In contrast to epitaxial BaFe<sub>1</sub><sub>2</sub>O<sub>1...

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spelling ndltd-NEU--neu-3305892016-04-25T16:14:07ZGrowth and characterization of thick oriented barium hexaferrite films on MgO (111) substratesHighly oriented films of BaFe<sub>1</sub><sub>2</sub>O<sub>1</sub><sub>9</sub> have been deposited onto MgO (111) substrates by pulsed laser ablation deposition. In contrast to epitaxial BaFe<sub>1</sub><sub>2</sub>O<sub>1</sub><sub>9</sub> films grown on Al<sub>2</sub>O<sub>3</sub> (001) substrates, these films experience an in-plane biaxial compressive stress, and do not crack or delaminate to thicknesses of at least 28 μm. X-ray diffraction, magnetometry, torque magnetometry, and ferrimagnetic resonance results all indicate excellent c-axis orientation normal to the film plane, and magnetic properties comparable to bulk values. The thickness and properties of these films approach those required for applications in low-loss self-biased nonreciprocal microwave deviceshttp://hdl.handle.net/2047/d20002228
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description Highly oriented films of BaFe<sub>1</sub><sub>2</sub>O<sub>1</sub><sub>9</sub> have been deposited onto MgO (111) substrates by pulsed laser ablation deposition. In contrast to epitaxial BaFe<sub>1</sub><sub>2</sub>O<sub>1</sub><sub>9</sub> films grown on Al<sub>2</sub>O<sub>3</sub> (001) substrates, these films experience an in-plane biaxial compressive stress, and do not crack or delaminate to thicknesses of at least 28 μm. X-ray diffraction, magnetometry, torque magnetometry, and ferrimagnetic resonance results all indicate excellent c-axis orientation normal to the film plane, and magnetic properties comparable to bulk values. The thickness and properties of these films approach those required for applications in low-loss self-biased nonreciprocal microwave devices
title Growth and characterization of thick oriented barium hexaferrite films on MgO (111) substrates
spellingShingle Growth and characterization of thick oriented barium hexaferrite films on MgO (111) substrates
title_short Growth and characterization of thick oriented barium hexaferrite films on MgO (111) substrates
title_full Growth and characterization of thick oriented barium hexaferrite films on MgO (111) substrates
title_fullStr Growth and characterization of thick oriented barium hexaferrite films on MgO (111) substrates
title_full_unstemmed Growth and characterization of thick oriented barium hexaferrite films on MgO (111) substrates
title_sort growth and characterization of thick oriented barium hexaferrite films on mgo (111) substrates
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url http://hdl.handle.net/2047/d20002228
_version_ 1718235658123739136