Characterization of deep level defects in InGaAsN /
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| Language: | English |
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The Ohio State University / OhioLINK
2002
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| Online Access: | http://rave.ohiolink.edu/etdc/view?acc_num=osu148640228826322 |
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ndltd-OhioLink-oai-etd.ohiolink.edu-osu148640228826322 |
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oai_dc |
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ndltd-OhioLink-oai-etd.ohiolink.edu-osu1486402288263222021-08-03T06:40:48Z Characterization of deep level defects in InGaAsN / Kaplar, Robert J. Engineering 2002 English text The Ohio State University / OhioLINK http://rave.ohiolink.edu/etdc/view?acc_num=osu148640228826322 http://rave.ohiolink.edu/etdc/view?acc_num=osu148640228826322 unrestricted This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws. |
| collection |
NDLTD |
| language |
English |
| sources |
NDLTD |
| topic |
Engineering |
| spellingShingle |
Engineering Kaplar, Robert J. Characterization of deep level defects in InGaAsN / |
| author |
Kaplar, Robert J. |
| author_facet |
Kaplar, Robert J. |
| author_sort |
Kaplar, Robert J. |
| title |
Characterization of deep level defects in InGaAsN / |
| title_short |
Characterization of deep level defects in InGaAsN / |
| title_full |
Characterization of deep level defects in InGaAsN / |
| title_fullStr |
Characterization of deep level defects in InGaAsN / |
| title_full_unstemmed |
Characterization of deep level defects in InGaAsN / |
| title_sort |
characterization of deep level defects in ingaasn / |
| publisher |
The Ohio State University / OhioLINK |
| publishDate |
2002 |
| url |
http://rave.ohiolink.edu/etdc/view?acc_num=osu148640228826322 |
| work_keys_str_mv |
AT kaplarrobertj characterizationofdeepleveldefectsiningaasn |
| _version_ |
1719441545772400640 |