Characterization of deep level defects in InGaAsN /

Characterization of deep level defects in InGaAsN /

Bibliographic Details
Main Author:	Kaplar, Robert J.
Language:	English
Published:	The Ohio State University / OhioLINK 2002
Subjects:	Engineering
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=osu148640228826322

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