Spectroscopic Ellipsometry as a Versatile, Non-Contact Probe of Optical, Electrical, and Structural Properties in Thin Films: Applications in Photovoltaics
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| Language: | English |
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University of Toledo / OhioLINK
2017
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| Online Access: | http://rave.ohiolink.edu/etdc/view?acc_num=toledo1493148258156143 |