Synthesis of Thin Films in Boron-Carbon-Nitrogen Ternary System by Microwave Plasma Enhanced Chemical Vapor Deposition

Bibliographic Details
Main Author: Kukreja, Ratandeep
Language:English
Published: University of Cincinnati / OhioLINK 2010
Subjects:
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=ucin1285688216
id ndltd-OhioLink-oai-etd.ohiolink.edu-ucin1285688216
record_format oai_dc
collection NDLTD
language English
sources NDLTD
topic Materials Science
Microwave Plasma CVD
Carbon Nitride Thin Films
Boron Nitride Thin Films
Low Temperature Diamond Thin Films
Nano-Seeding
Residual Stress
spellingShingle Materials Science
Microwave Plasma CVD
Carbon Nitride Thin Films
Boron Nitride Thin Films
Low Temperature Diamond Thin Films
Nano-Seeding
Residual Stress
Kukreja, Ratandeep
Synthesis of Thin Films in Boron-Carbon-Nitrogen Ternary System by Microwave Plasma Enhanced Chemical Vapor Deposition
author Kukreja, Ratandeep
author_facet Kukreja, Ratandeep
author_sort Kukreja, Ratandeep
title Synthesis of Thin Films in Boron-Carbon-Nitrogen Ternary System by Microwave Plasma Enhanced Chemical Vapor Deposition
title_short Synthesis of Thin Films in Boron-Carbon-Nitrogen Ternary System by Microwave Plasma Enhanced Chemical Vapor Deposition
title_full Synthesis of Thin Films in Boron-Carbon-Nitrogen Ternary System by Microwave Plasma Enhanced Chemical Vapor Deposition
title_fullStr Synthesis of Thin Films in Boron-Carbon-Nitrogen Ternary System by Microwave Plasma Enhanced Chemical Vapor Deposition
title_full_unstemmed Synthesis of Thin Films in Boron-Carbon-Nitrogen Ternary System by Microwave Plasma Enhanced Chemical Vapor Deposition
title_sort synthesis of thin films in boron-carbon-nitrogen ternary system by microwave plasma enhanced chemical vapor deposition
publisher University of Cincinnati / OhioLINK
publishDate 2010
url http://rave.ohiolink.edu/etdc/view?acc_num=ucin1285688216
work_keys_str_mv AT kukrejaratandeep synthesisofthinfilmsinboroncarbonnitrogenternarysystembymicrowaveplasmaenhancedchemicalvapordeposition
_version_ 1719433268724498432
spelling ndltd-OhioLink-oai-etd.ohiolink.edu-ucin12856882162021-08-03T06:14:20Z Synthesis of Thin Films in Boron-Carbon-Nitrogen Ternary System by Microwave Plasma Enhanced Chemical Vapor Deposition Kukreja, Ratandeep Materials Science Microwave Plasma CVD Carbon Nitride Thin Films Boron Nitride Thin Films Low Temperature Diamond Thin Films Nano-Seeding Residual Stress <p>The Boron Carbon Nitorgen (B-C-N) ternary system includes materials with exceptional properties such as wide band gap, excellent thermal conductivity, high bulk modulus, extreme hardness and transparency in the optical and UV range that find application in most fields ranging from micro-electronics, bio-sensors, and cutting tools to materials for space age technology. Interesting materials that belong to the B-C-N ternary system include Carbon nano-tubes, Boron Carbide, Boron Carbon Nitride (B-CN), hexagonal Boron Nitride (h-BN), cubic Boron Nitride (c-BN), Diamond and beta Carbon Nitride (β-C<sub>3</sub>N4). Synthesis of these materials requires precisely controlled and energetically favorable conditions.</p> <p>Chemical vapor deposition is widely used technique for deposition of thin films of ceramics, metals and metal-organic compounds. Microwave plasma enhanced chemical vapor deposition (MPECVD) is especially interesting because of its ability to deposit materials that are meta-stable under the deposition conditions, for e.g. diamond. In the present study, attempt has been made to synthesize beta-carbon nitride (β-C<sub>3</sub>N<sub>4</sub>) and cubic-Boron Nitride (c-BN) thin films by MPECVD. Also included is the investigation of dependence of residual stress and thermal conductivity of the diamond thin films, deposited by MPECVD, on substrate pre-treatment and deposition temperature.</p> <p>Si incorporated CN<sub>x</sub> thin films are synthesized and characterized while attempting to deposit β-C<sub>3</sub>N<sub>4</sub> thin films on Si substrates using Methane (CH<sub>4</sub>), Nitrogen (N<sub>2</sub>), and Hydrogen (H<sub>2</sub>). It is shown that the composition and morphology of Si incorporated CNx thin film can be tailored by controlling the sequence of introduction of the precursor gases in the plasma chamber. Greater than 100µm size hexagonal crystals of N-Si-C are deposited when Nitrogen precursor is introduced first while agglomerates of nano-meter range graphitic needles of C-Si-N are deposited when Carbon precursor is introduced first in the deposition chamber.</p> <p>Hexagonal – BN thin films are successfully deposited using Diborane (B<sub>2</sub>H<sub>6</sub>) (5% in H<sub>2</sub>), Ammonia (NH<sub>3</sub>) and H<sub>2</sub> as precursor gases in the conventional MPECVD mode with and without the negative DC bias. The quality of h-BN in the films improved with pressure and when NH<sub>3</sub> used as the first precursor gas in the deposition chamber.</p> <p>c-BN thin films are successfully deposited using Boron-Trifluoride (BF<sub>3</sub>) (10% in Argon (Ar)), N<sub>2</sub>, H<sub>2</sub>, Ar and Helium (He) gases in the electron cyclotron resonance (ECR) mode of the MPECVD system with negative DC bias. Up-to 66% c-BN in the films is achieved under deposition conditions of lower gas flow rates and higher deposition pressures than that reported in the literature for film deposited by ECR-MPECVD. It is shown that the percentage c-BN in the films correlates with the deposition pressure, BF<sub>3</sub>/H<sub>2</sub> ratio and, negative DC bias during nucleation and growth.</p> <p>Diamond thin films are deposited using 60%Ar, 39% H<sub>2</sub> and, 1%CH<sub>4</sub> at 600°C, 700°C and 800°C substrate temperatures, measured by an IR pyrometer, on Si substrates pre-treated with 3-6nm diamond sol and 20-40µm diamond slurry. Raman spectroscopy, FTIR, X-Ray diffraction (XRD) and, photo-thermal reflectivity methods are used to characterize the thin films. Residual stresses observed for the diamond thin films deposited in this study are tensile in nature and increased with deposition temperature. Better quality diamond films with lower residual stresses are obtained for films deposited on Si substrate pre-treated with 3-6nm diamond sol. Preliminary results on thermal conductivity, k, suggest that k is directly dependent on the deposition temperature and independent of substrate pre-treatment signifying that the nano-seeding technique can be used to replace conventional surface activation technique for diamond seeding where needed.</p> 2010 English text University of Cincinnati / OhioLINK http://rave.ohiolink.edu/etdc/view?acc_num=ucin1285688216 http://rave.ohiolink.edu/etdc/view?acc_num=ucin1285688216 unrestricted This thesis or dissertation is protected by copyright: some rights reserved. It is licensed for use under a Creative Commons license. Specific terms and permissions are available from this document's record in the OhioLINK ETD Center.